Erratic cell behavior in channel hot electron programming of NOR flash memories

✍ Scribed by Grossi, M.; Lanzoni, M.; Ricco, B.

• Book ID: 114617561
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 567 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2004.834903