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Erbium photoluminescence excitation spectroscopy in Si: Er epitaxial structures

✍ Scribed by B. A. Andreev; Z. F. Krasil’nik; A. N. Yablonsky; V. P. Kuznetsov; T. Gregorkiewicz; M. A. J. Klik

Book ID: 110140955
Publisher: SP MAIK Nauka/Interperiodica
Year: 2005
Tongue: English
Weight: 52 KB
Volume: 47
Category: Article
ISSN: 1063-7834
DOI: 10.1134/1.1853451

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The photoluminescence (PL) excitation spectrum (intensity of PL as a function of the wavelength of the exciting light) has been measured over the range 1.0 -1.25 eV for PL at 0.79 eV using a free electron laser (FEL) as the excitation source. At all wavelengths, the PL intensity varies with incident