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Erbium and Germanium Profiles in Si1 – xGexLayers Grown by Silicon Sublimation-Source Molecular-Beam Epitaxy in GeH4

✍ Scribed by V. G. Shengurov; S. P. Svetlov; V. Yu. Chalkov; B. A. Andreev; Z. F. Krasil'nik; B. Ya. Ber; Yu. N. Drozdov

No coin nor oath required. For personal study only.

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