𝔖 Bobbio Scriptorium

✦ LIBER ✦

Equivalent circuit concepts for electronic failure analysis : J. A. Connor, Proc. Ann. Symp. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12–14 January (1971), p. 110

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 104 KB
Volume: 10
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(71)90140-5

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A Bayesian time-to-failure distribution

A Bayesian time-to-failure distribution : J. H. Engleman, Proc. Ann. Symp. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12–14 January (1971), p. 350

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 72 KB

Engineering application of failure data

Engineering application of failure data : S. J. Keene, Jr., Proc. Ann. Symp. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12–14 January (1971), p. 104

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 72 KB

On simplifying mission reliability calcu

On simplifying mission reliability calculations : R. A. Kowalski, Proc. Ann. Symp. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12–14 January (1971), p. 261

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 111 KB

Reliability data for improving ship syst

Reliability data for improving ship systems : S. Levine, Proc. Ann. Symp. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12–14 January (1971), p. 238

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 214 KB

A design procedure for discard VS repair

A design procedure for discard VS repair decisions : J. Bruno, Proc. Ann. Symp. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12–14 January (1971), p. 278

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 111 KB

Economic formulation of reliability obje

Economic formulation of reliability objectives : H. Hecht, Proc. Ann. Symp. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12–14 January (1971), p. 280

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 179 KB