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A Bayesian time-to-failure distribution : J. H. Engleman, Proc. Ann. Symp. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12–14 January (1971), p. 350

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 72 KB
Volume: 10
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(71)90116-8

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