✦ LIBER ✦

Epitaxial Layer Thickness Measurement by Far Infrared Ellipsometry

✍ Scribed by DeNicola, R. O. ;Saifi, M. A. ;Frazee, R. E.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Phase Shift Corrections for Infrared Int

✍ Schumann, P. A.; Phillips, R. P.; Olshefski, P. J. 📂 Article 📅 1966 🏛 The Electrochemical Society 🌐 English ⚖ 446 KB

Epitaxial layer thickness measurements u

✍ R. A. Moellering; L. B. Bauer; C. L. Balestra 📂 Article 📅 1990 🏛 Springer US 🌐 English ⚖ 462 KB

On the Infrared Thickness Measurement of

✍ Severin, P. J. 📂 Article 📅 1970 🏛 The Optical Society 🌐 English ⚖ 798 KB

Epitaxial layer thickness measurements b

✍ L. E. Tarof; C. J. Miner; A. J. Springthorpe 📂 Article 📅 1989 🏛 Springer US 🌐 English ⚖ 762 KB

Thickness Measurement of Epitaxial Films

✍ Albert, M. P.; Combs, J. F. 📂 Article 📅 1962 🏛 The Electrochemical Society 🌐 English ⚖ 492 KB

Zircaloy oxide thickness measurement by

✍ Y.-K. Peng; N.M. Bashara 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 637 KB