## Precision Lattice Parameter Measurements of WE-Gap-Epitaxial Layers by the Wmweganregung" Method The "Umweganregung" technique according to a method described by SPOONER and WIL-SON was used for the accurate measurement of lattice parameters of (100) slice of VPEgrown layers of gallium phosphid
✦ LIBER ✦
Epitaxial growth of ZnSexTe1−x by the VPE method and its photoluminescence
✍ Scribed by K. Mochizuki; H. Oguri; T. Kyotani; M. Isshiki
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 254 KB
- Volume
- 92
- Category
- Article
- ISSN
- 0169-4332
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