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Epitaxial films grown by vacuum MOCVD

✍ Scribed by L.M. Fraas; P.S. McLeod; J.A. Cape; L.D. Partain


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
638 KB
Volume
68
Category
Article
ISSN
0022-0248

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Laue oscillations) appear close to the high-angle reflections. The film thickness can then be evaluated as: where W i and W i-1 are positions of adjacent satellite maxima.