Entropy-based optimum test points selection for analog fault dictionary techniques

✍ Scribed by Starzyk, J.A.; Dong Liu; Zhi-Hong Liu; Nelson, D.E.; Rutkowski, J.O.

• Book ID: 114629577
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 255 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2004.827085