✦ LIBER ✦

A test points selection method for analog fault dictionary techniques

✍ Scribed by Chenglin Yang; Shulin Tian; Bing Long; Fang Chen

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A Novel Test Point Selection Method for

✍ ChengLin Yang; ShuLin Tian; Bing Long; Fang Chen 📂 Article 📅 2010 🏛 Springer US 🌐 English ⚖ 312 KB

Test Points Selection for Analog Fault D

✍ Chenglin Yang; Shulin Tian; Bing Long 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 277 KB

Entropy-based optimum test points select

✍ Starzyk, J.A.; Dong Liu; Zhi-Hong Liu; Nelson, D.E.; Rutkowski, J.O. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 255 KB

Application of Heuristic Graph Search to

✍ Chenglin Yang; Shulin Tian; Bing Long 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 948 KB

Selection of test nodes for analog fault

✍ Prasad, V.C.; Babu, N.S.C. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 235 KB

Symbolic Techniques for the Selection of

✍ F. Grasso; A. Luchetta; S. Manetti; M.C. Piccirilli 📂 Article 📅 2004 🏛 Springer 🌐 English ⚖ 276 KB