Enhanced reliability in Si MOSFETs with channel lengths under 0.2 micron : Lindor Henrickson, Zezhong Peng, Jeffrey Frey and Neil Goldsman. Solid-St. Electron.33(10), 1275 (1990)

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 128 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90156-2