Enhanced leakage current properties of HfO2/GaN gate dielectric stack by introducing an ultrathin buffer layer

✍ Scribed by Tang, Zhen Jie; Li, Rong; Yin, Jiang

• Book ID: 121580409
• Publisher: Springer US
• Year: 2013
• Tongue: English
• Weight: 494 KB
• Volume: 25
• Category: Article
• ISSN: 0957-4522
• DOI: 10.1007/s10854-013-1565-8