Energy loss of electrons in thick Cu foils
β Scribed by K.J. Van Camp; V.J. Vanhuyse
- Publisher
- Elsevier Science
- Year
- 1965
- Weight
- 208 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0031-9163
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## Abstract Measurements of thickness using electron energy loss spectroscopy (EELS) are revised. Absolute thickness values can be quickly and accurately determined with the KramersβKronig sum method. The EELS data analysis is even much easier with the logβratio method, however, absolute calibratio
The energy loss of 132 Xe-ions in C, Al, Ni, Ag, Lu, Au, Pb and Th foils was measured in the energy range from 0.1 to 5 MeV/u using the TOF-E method. The results are compared with previously published data and with the predictions of several computer codes. They include theoretical codes: PASS, CASP