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Energy distributions and excitation probability of nickel atoms sputtered from Ni3Al, NiAl and Ni

✍ Scribed by M Tan; B.V King


Book ID
108417890
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
100 KB
Volume
203-204
Category
Article
ISSN
0169-4332

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The energy and angular distributions of Ni and Al atoms sputtered from Ni 3 Al(100) by 8 keV Ar have been measured using multiphoton resonance ionization detection. The Al atoms, which originate entirely from the top atomic layer of Ni 3 Al(100), are predominantly sputtered along close packed <110>