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Energy Dispersive X-ray Reflection from a Liquid-Liquid Interface

✍ Scribed by Roser, S. J.; Felici, R.; Eaglesham, A.


Book ID
127125885
Publisher
American Chemical Society
Year
1994
Tongue
English
Weight
882 KB
Volume
10
Category
Article
ISSN
0743-7463

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X-ray specular reflectivity of the 4He l
✍ L.B. Lurio; T.A. Rabedeau; P.S. Pershan; Isaac F. Silvera πŸ“‚ Article πŸ“… 1991 πŸ› Elsevier Science 🌐 English βš– 157 KB

X-ray specular reflectivity measurements of a saturated film of helium absorbed onto an atomically flat silicon substrate have been made at several temperatures. The thickness of the film has been determined and some preliminary data on the structure of the 4He liquid-vapor interface are reported.