Vacancy-type defects and electronic stru
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Hamid, A. S. ;Uedono, A. ;Chikyow, T. ;Uwe, K. ;Mochizuki, K. ;Kawaminami, S.
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Article
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2006
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John Wiley and Sons
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English
⚖ 237 KB
## Abstract The vacancy‐type defects in Nb‐doped SrTiO~3~ and in undoped SrTiO~3~, annealed in H~2~ flow, were investigated by means of positron lifetime and 2D angular correlation of annihilation radiation (ACAR) experiments. The calculations of the lifetime of positron were performed by using ato