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Empirical Characterization of Low-Temperature Magnetoresistance Effects in Heavily Doped Ge and Si

✍ Scribed by Roth, H.; Straub, W.; Bernard, W.; Mulhern, J.

Book ID: 115443626
Publisher: The American Physical Society
Year: 1963
Tongue: English
Weight: 289 KB
Volume: 11
Category: Article
ISSN: 0031-9007
DOI: 10.1103/physrevlett.11.328

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