EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany || Quantification and Segmentation of Electron Tomography Data- Exemplified at ErSi2 Nanocrystals in SiC

✍ Scribed by Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas

• Book ID: 120183163
• Publisher: Springer Berlin Heidelberg
• Year: 2008
• Weight: 300 KB
• Category: Article
• ISBN: 3540851569
• DOI: 10.1007/978-3-540-85156-1_161