EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany || Response function of the semiconductor detector of backscattered electrons in SEM

✍ Scribed by Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas

• Book ID: 120931482
• Publisher: Springer Berlin Heidelberg
• Year: 2008
• Weight: 269 KB
• Category: Article
• ISBN: 3540851569
• DOI: 10.1007/978-3-540-85156-1_302