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Embedded test control schemes using iBIST for SOCs

✍ Scribed by Kay, D.; Sung Chung; Mourad, S.

Book ID: 114629903
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 656 KB
Volume: 54
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2005.847349

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