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Embedded loopback test for RF ICs

✍ Scribed by Yoon, J.-S.; Eisenstadt, W.R.

Book ID: 114630000
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 526 KB
Volume: 54
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2005.855091

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