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Reducing Test Time Using an Enhanced RF Loopback

✍ Scribed by Marcelo Negreiros; Luigi Carro; Altamiro Amadeu Susin

Book ID: 106384352
Publisher: Springer US
Year: 2007
Tongue: English
Weight: 489 KB
Volume: 23
Category: Article
ISSN: 0923-8174
DOI: 10.1007/s10836-007-5026-2

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