Ellipsometry of anodic oxide films on tungsten
โ Scribed by J. Sarakinos; J. Spyridelis
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 481 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
## Abstract Anodic oxide films were grown on SiC using various electrolytes. The obtained oxide films were compared and some of their electrophysical properties were investigated. Anodic oxidation of SiC was shown to be useful for precise removal of layers as well as for identification of the polar
The physico-chemical properties of the anodic niobium oxide films grown potentiodynamically in 1M Na CO solutions were studied. Capacj ' ty measurements and Schottky-Mott plots wer $ obtained for different thicknesses. A phenomenological description of the oxide film behaviour is reported.