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Ellipsometry and optical measurements on amorphous thin films of As2Se3

✍ Scribed by M. M. El-Ocker; F. Sharaf; M. K. El-Mously

Publisher: Springer
Year: 1992
Tongue: English
Weight: 273 KB
Volume: 27
Category: Article
ISSN: 0022-2461
DOI: 10.1007/bf01142012

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