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Ellipsometric study of silicon nanocrystal optical constants

✍ Scribed by Amans, D.; Callard, S.; Gagnaire, A.; Joseph, J.; Ledoux, G.; Huisken, F.

Book ID: 111672571
Publisher: American Institute of Physics
Year: 2003
Tongue: English
Weight: 498 KB
Volume: 93
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1538344

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