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Ellipsometric characterization of nanocrystals in porous silicon

✍ Scribed by P. Petrik; M. Fried; É. Vázsonyi; T. Lohner; E. Horváth; O. Polgár; P. Basa; I. Bársony; J. Gyulai

No coin nor oath required. For personal study only.

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