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Porous Anodic 4H-SiC: Thickness Dependent Anisotropy in Pore Propagation and Ellipsometric Characterization

✍ Scribed by Zangooie, S. ;Arwin, H.


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
227 KB
Volume
182
Category
Article
ISSN
0031-8965

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