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Ellipsometric and XPS characterization of transparent nickel oxide thin films deposited by reactive HiPIMS

✍ Scribed by Nguyen, D.T.; Ferrec, A.; Keraudy, J.; Richard-Plouet, M.; Goullet, A.; Cattin, L.; Brohan, L.; Jouan, P.-Y.

No coin nor oath required. For personal study only.

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