Elimination of Artifacts in External Quantum Efficiency Measurements of Multijunction Solar Cells Using a Pulsed Voltage Bias

✍ Scribed by Li, Jing-Jing; Allen, Charles R.; Lim, Swee Hoe; Zhang, Yong-Hang

• Book ID: 121835839
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 2013
• Tongue: English
• Weight: 628 KB
• Volume: 3
• Category: Article
• ISSN: 2156-3381
• DOI: 10.1109/JPHOTOV.2013.2242959