Elimination of Artifacts in External Quantum Efficiency Measurements for Multijunction Solar Cells Using a Pulsed Light Bias

✍ Scribed by Li, Jing-Jing; Zhang, Yong-Hang

• Book ID: 121830732
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 2013
• Tongue: English
• Weight: 454 KB
• Volume: 3
• Category: Article
• ISSN: 2156-3381
• DOI: 10.1109/JPHOTOV.2012.2216512