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Electrothermal characteristics of strained-Si MOSFETs in high-current operation

✍ Scribed by Chang-Hoon Choi; Jung-Hoon Chun; Dutton, R.W.

Book ID: 114617590
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 292 KB
Volume: 51
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2004.836542

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