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Electrostatic discharge thermal failure in semiconductor devices

โœ Scribed by Dwyer, V.M.; Franklin, A.J.; Campbell, D.S.


Book ID
114536975
Publisher
IEEE
Year
1990
Tongue
English
Weight
576 KB
Volume
37
Category
Article
ISSN
0018-9383

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Thermal failure in semiconductor devices
โœ V.M. Dwyer; A.J. Franklin; D.S. Campbell ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 697 KB