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Electrooptical detection of interface states in heterojunctions

✍ Scribed by Halé, J.


Publisher
John Wiley and Sons
Year
1970
Tongue
English
Weight
409 KB
Volume
1
Category
Article
ISSN
0031-8965

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Properties of interfaces in amorphous/cr
✍ Olibet, Sara ;Vallat-Sauvain, Evelyne ;Fesquet, Luc ;Monachon, Christian ;Hessle 📂 Article 📅 2010 🏛 John Wiley and Sons 🌐 English ⚖ 852 KB

## Abstract To study recombination at the amorphous/crystalline Si (a‐Si:H/c‐Si) heterointerface, the amphoteric nature of silicon (Si) dangling bonds is taken into account. Modeling interface recombination measured on various test structures provides insight into the microscopic passivation mechan