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Electrooptic waveguide switch using total internal reflection

✍ Scribed by I. Savatinova; S. Tonchev


Publisher
Springer
Year
1983
Tongue
English
Weight
462 KB
Volume
31
Category
Article
ISSN
1432-0630

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## Abstract In modern fluorescence microscopy, lasers are a widely used source of light, both for imaging in total internal reflection and epi‐illumination modes. In wide‐field imaging, scattering of highly coherent laser light due to imperfections in the light path typically leads to nonuniform il