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Electronic structure of complex copper systems probed by resonant inelastic X-ray scattering at Cu edge

โœ Scribed by K.O. Kvashnina; S.M. Butorin; A. Modin; L. Werme; J. Nordgren; J.-H. Guo; R. Berger


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
843 KB
Volume
404
Category
Article
ISSN
0921-4526

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