Resonant inelastic X-ray scattering applied to the electronic structure of strongly correlated systems: The YBCO case

✍ Scribed by J.-M. Mariot; M. Sacchi; L. Journel; J.-J. Gallet; M. McElfresh; C.F. Hague

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 144 KB
• Volume: 246
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2005.12.027