Electronic structure of Al, P, S, and Cl impurities in silicon
β Scribed by M. Thiagarajan; K. Iyakutti; E. Palaniyandi; M. Mahendran
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 385 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0020-7608
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β¦ Synopsis
We report a fully self-consistent investigation of the electronic structure, relation between charge transfer and electronegativity, bonding characteristics, and alloying of Al, P, S, and C1 with silicon. The present study indicates that the charge transfer from the host Si atoms to the central impurity atom increases with electronegativity of the impurity element. The bonding between host Si atoms and the impurity atoms is ionic in nature.
π SIMILAR VOLUMES
A recombination radiation line (S-line) of surface 2D holes and 2D nonequilibrium electrons is observed in electroluminescence spectra of tunneling [100] silicon MOS (metalΒ±oxideΒ±semiconductor) diodes under tunneling injection of electrons into a selforganized electron quantum well. The electron qua