✦ LIBER ✦

Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering

✍ Scribed by Yufeng Zhang; James E. Downes; Shancai Wang; Timothy Learmonth; Lukasz Plucinski; A.Y. Matsuura; Cormac McGuinness; Per-Anders Glans; Sarah Bernardis; Cian O'Donnell; Kevin E. Smith

Book ID: 108289300
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 496 KB
Volume: 515
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2005.12.221

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Electronic Structure of the Organic Cond

Electronic Structure of the Organic Conductorsκ-ET2Cu(SCN)2andκ-ET2Cu[N(CN)2]Br Studied Using Soft X-ray Absorption and Soft X-ray Emission

✍ Cristian B. Stagarescu; Laurent-C. Duda; Kevin E. Smith; D.-K. Seo; M.-H. Whangb 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 385 KB

The problem of resolving molecular components of the electronic structure of complex, organic solids with respect to their chemical and orbital character has been approached using corelevel photon spectroscopies. Specifically, the bulk C 2p occupied and unoccupied partial densities of states (PDOS)

Study of 4f inner shell excitations in G

Study of 4f inner shell excitations in Gd and Tb using resonant inelastic soft X-ray scattering

✍ A. Moewes; R.P. Winarski; D.L. Ederer; M.M. Grush; T.A. Callcott 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 194 KB

Electronic structure of hydrogenated amo

Electronic structure of hydrogenated amorphous Si1-xNxthin films using soft X-ray emission and absorption measurements

✍ Boyko, Teak ;Kasap, Safa ;Johanson, Robert ;Kobayashi, S. ;Aoki, T. ;Moewes, Ale 📂 Article 📅 2009 🏛 John Wiley and Sons 🌐 English ⚖ 447 KB

## Abstract Hydrogenated amorphous silicon nitride thin films (a‐Si~1–__x__~ N__~x~__:H) with __x__ = 0.46, 0.54, 0.55 and 0.58 have been studied. The optical bandgaps of these materials were 2.41, 2.78, 3.29 and 3.85 eV and Urbach edge bandgaps were 2.80, 3.27, 3.85 and 4.04 eV (W. C. Tan et al.,

Study of electronic structures for Fe th

Study of electronic structures for Fe thin films deposited on Si- and C-faces of 4H–SiC substrates by soft X-ray emission spectroscopy

✍ M. Hirai; T. Wakita; H. Okazaki; D. Koishihara; Y. Muraoka; T. Yokoya 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 153 KB

Vacancy-induced electronic states in sub

Vacancy-induced electronic states in substoichiometric V2 −xMoxO3 ±ythin films and powders—A soft X-ray emission study

✍ B S Acharya; Rajeev; L D Pradhan; B B Nayak; Pushparani Mishra 📂 Article 📅 1999 🏛 Springer-Verlag 🌐 English ⚖ 425 KB

Synchrotron white beam X-ray topography,

Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films

✍ M. Dudley; J. Bai; X. Huang; W.M. Vetter; G. Dhanaraj; B. Raghothamachar 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 677 KB