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Electronic structure and bonding in silicon oxynitride films: An XPS study

โœ Scribed by M.S. Hegde; R. Caracciolo; K.S. Hatton; J.B. Wachtman Jr.

Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
336 KB
Volume
37
Category
Article
ISSN
0169-4332

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## Abstract This paper discusses recent progress that has been made in the understanding of the electronic structure and bonding situation of carbon monoxide which was analyzed using modern quantum chemical methods. The new results are compared with standard models of chemical bonding. The electron