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Electronic properties of amorphous zinc tin oxide films by junction capacitance methods

✍ Scribed by Peter T. Erslev; Hai Q. Chiang; David Hong; John F. Wager; J. David Cohen


Book ID
116670909
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
130 KB
Volume
354
Category
Article
ISSN
0022-3093

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