✦ LIBER ✦

Electronic conductivity and electromigration in metallic microstructures

✍ Scribed by R.S. Sorbello; C.S. Chu

Book ID: 103917654
Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 286 KB
Volume: 3
Category: Article
ISSN: 0749-6036
DOI: 10.1016/0749-6036(87)90225-4

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Conduction Electrons in Metals

✍ Azbel, M. Ya.; Kaganov, M. I.; Lifshitz, I. M. 📂 Article 📅 1973 🏛 Nature Publishing Group 🌐 English ⚖ 994 KB

Microstructure and electromigration in c

Microstructure and electromigration in copper damascene lines

✍ Lucile Arnaud; G. Tartavel; T. Berger; D. Mariolle; Y. Gobil; I. Touet 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 762 KB

Electromigration and crevice formation i

Electromigration and crevice formation in thin metallic films

✍ I.A. Blech 📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 739 KB

Landauer fields in electron transport an

Landauer fields in electron transport and electromigration

✍ R.S. Sorbello 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 127 KB

Landauer's classic 1957 paper on electron transport in the presence of localized scatterers has provided a powerful approach for analysing the local transport field and the driving force for electromigration in metals. This approach leads to local fields which are associated with residual resistivit

Antiferromagnetism and metallic conducti

Antiferromagnetism and metallic conductivity in Nb12O29

✍ Cava, R. J.; Batlogg, B.; Krajewski, J. J.; Gammel, P.; Poulsen, H. F.; Peck, W. 📂 Article 📅 1991 🏛 Nature Publishing Group 🌐 English ⚖ 342 KB

Atom probe microanalysis and nanoscale m

Atom probe microanalysis and nanoscale microstructures in metallic materials

✍ K. Hono 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 643 KB