Electron Velocity Distribution at a Sheath Edge in the Presence of Secondary Electron Emission From a Metal Surface

Secondary Electron Emission Yields from

Secondary Electron Emission Yields from a CsI Surface Under Impacts of Large Molecules at Low Velocities (5 × 103−7 × 104 ms−1)

✍ A. Brunelle; P. Chaurand; S. Della-Negra; Y. Le Beyec; E. Parilis 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 199 KB

The yields of electron emission from a CsI surface bombarded with very heavy molecular ions have been measured by coincidence counting in time-of-flight mass spectrometry. These ions were produced by the matrix-assisted laser desorption/ionization technique. The masses ranged from 700 to 66 000 Da w