Secondary Electron Emission Yields from a CsI Surface Under Impacts of Large Molecules at Low Velocities (5 × 103−7 × 104 ms−1)
✍ Scribed by A. Brunelle; P. Chaurand; S. Della-Negra; Y. Le Beyec; E. Parilis
- Publisher
- John Wiley and Sons
- Year
- 1997
- Tongue
- English
- Weight
- 199 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0951-4198
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✦ Synopsis
The yields of electron emission from a CsI surface bombarded with very heavy molecular ions have been measured by coincidence counting in time-of-flight mass spectrometry. These ions were produced by the matrix-assisted laser desorption/ionization technique. The masses ranged from 700 to 66 000 Da with velocities V between 5 × 10 3 and 7 × 10 4 ms -1 . An electron emission rate of a few per cent was measured for the smaller impact velocities. The variations of the electron yields with mass and velocity are compared to previous data and analysed by different models. A sublinear mass dependence is observed as well as a V 4 dependence at low velocity.