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Electron tunneling through chemical oxide of silicon

✍ Scribed by T. Hattori; K. Watanabe; M. Ohashi; M. Matsuda; M. Yasutake

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 299 KB
Volume: 102
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(96)00026-8

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