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Electron-tunneling analysis of defect structure in near-surface layers of conducting materials

✍ Scribed by I. V. Boylo; M. A. Belogolovskii

Book ID: 114992863
Publisher: SP MAIK Nauka/Interperiodica
Year: 2012
Tongue: English
Weight: 172 KB
Volume: 38
Category: Article
ISSN: 1063-7850
DOI: 10.1134/s1063785012020204

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