Electron traps at a photooxidised anthra
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G. Dietrich; H. Pick; H. Bauser
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Article
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1975
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Elsevier Science
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English
β 339 KB
Electron traps at the surface of photooxidised sntlxxene crystz!s were studied by thermally stimnlnted currents. The trap depth KG c&Mated to be Et = (1.0 k 0.1) eV. Thhcse surfnm txps may nccouni fur the onhonccd optical ids