𝔖 Bobbio Scriptorium
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Electron traps at a photooxidised anthracene surface

✍ Scribed by G. Dietrich; H. Pick; H. Bauser


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
339 KB
Volume
33
Category
Article
ISSN
0009-2614

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✦ Synopsis


Electron traps at the surface of photooxidised sntlxxene crystz!s were studied by thermally stimnlnted currents. The trap depth KG c&Mated to be Et = (1.0 k 0.1) eV. Thhcse surfnm txps may nccouni fur the onhonccd optical ids


πŸ“œ SIMILAR VOLUMES


Electron attachment to anthracene. A FAL
✍ A. Canosa; D.C. Parent; D. Pasquerault; auJ.C. Gomet; S. LaubΓ©; B.R. Rowe πŸ“‚ Article πŸ“… 1994 πŸ› Elsevier Science 🌐 English βš– 592 KB

The rate coefficient /? for electron attachment to anthracene has been measured at room temperature using a flowing afterglow Langmuir probe mass spectrometer. A value of 1 x 10e9 cm3 s-t (30% uncertainty) was found, indicating that an activation energy barrier might exist.