๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Electron Trapping in Single Crystal Cuprous Oxide

โœ Scribed by Schick, Jerome D.; Trivich, Dan


Book ID
125840482
Publisher
The Electrochemical Society
Year
1972
Tongue
English
Weight
618 KB
Volume
119
Category
Article
ISSN
0013-4651

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Photokinetics in single-crystal cuprous
โœ J.D Schick; D Trivich ๐Ÿ“‚ Article ๐Ÿ“… 1971 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 415 KB

The mino@y cakier lifetime of cuprous oxide is measured on si&e-cry~dal kamptes equilibrated a$ k&us oxygen pr&sures, and its dependence on oxygen par$ai pressuc~ is shown. This dependence sup~rts'the con~1usi~r1 that: '. copper atom va&cies @ve rise to recombination centers.

Growth of single crystal cuprous oxide
โœ W.S. Brower Jr.; H.S. Parker ๐Ÿ“‚ Article ๐Ÿ“… 1971 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 246 KB
Trap centers in cuprous oxide
โœ L. Papadimitriou; C.A. Dimitriadis; L. Dozsa ๐Ÿ“‚ Article ๐Ÿ“… 1988 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 560 KB
Deep trap levels in cuprous oxide
โœ L. Papadimitriou; C.A. Dimitriadis; L. Dozsa; L. Andor ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 356 KB