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Trap centers in cuprous oxide

โœ Scribed by L. Papadimitriou; C.A. Dimitriadis; L. Dozsa

Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
560 KB
Volume
31
Category
Article
ISSN
0038-1101

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The mino@y cakier lifetime of cuprous oxide is measured on si&e-cry~dal kamptes equilibrated a$ k&us oxygen pr&sures, and its dependence on oxygen par$ai pressuc~ is shown. This dependence sup~rts'the con~1usi~r1 that: '. copper atom va&cies @ve rise to recombination centers.