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Electron trap states and low frequency noise in tunnel junctions

✍ Scribed by Rogers, C.; Buhrman, R.; Gallagher, W.; Raider, S.; Kleinsasser, A.; Sandstrom, R.

Book ID
114648696
Publisher
IEEE
Year
1987
Tongue
English
Weight
429 KB
Volume
23
Category
Article
ISSN
0018-9464

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πŸ“œ SIMILAR VOLUMES

Low frequency noise in Co/Al2O3〈SiβŒͺ/Py m
Low frequency noise in Co/Al2O3〈SiβŒͺ/Py magnetic tunnel junctions
✍ Guerrero, R. ;Aliev, F. G. ;Villar, R. ;Santos, T. ;Moodera, J. πŸ“‚ Article πŸ“… 2008 πŸ› John Wiley and Sons 🌐 English βš– 326 KB

## Abstract Low frequency noise and dynamic tunneling resistance have been studied in Co(80 Γ…)/Al~2~O~3~(12 Γ…)/Py(100 Γ…) magnetic tunnel junctions (MTJs) with and without asymmetric Si doping of the insulating barrier (Si ≀ 1.8 Γ…). Variation of the dynamic resistance and tunneling resistance with S